AOE: Exhaustive Out-of-Distribution Detection via Recalibrating Outlier Labels

arXiv:2605.28021v1 Announce Type: new Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions. Outlier Exposure (OE) has emerged as a promising OOD detection paradigm by introducing auxiliary outliers during training to enlarge the margin between in-distribution (ID) and OOD samples. Existing OE-based methods typically enlarge this margin by employing uniform labels to

Source: arXiv cs.LG — read the full report at the original publisher.

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