Researchers from Stanford University and Google have published “ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions”. Abstract “Hyperscaler reports of silent data corruptions (SDCs)—presumed to be caused by silicon manufacturing defects—have motivated the development of functional tests for detecting defective CPUs and their use in hyperscaler fleet studies. Interestingly, all such tests seem... » read more The post Detecting Defect-Induced Silent Data Corruptions in CPUs (Stanford, Google) appeared first on Semiconductor Engineering .
Source: Semiconductor Engineering — read the full report at the original publisher.