arXiv:2605.26476v1 Announce Type: new Abstract: Retrieval-Augmented Generation (RAG) has become critical for knowledge-intensive applications, yet evaluating its performance in vertical domains remains difficult due to domain complexity, diverse context scales, and heavy reliance on expert assessments that are costly, inconsistent, and non-scalable. We introduce FAB-Bench, an end-to-end framework for adaptive benchmarking of RAG systems in semiconductor manufacturing. FAB-Bench defines six diagnostic metrics measuring factual accuracy, contextual utilization, completeness, retrieval relevance,

Source: arXiv cs.CL — read the full report at the original publisher.

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