Researchers from The University of Tokyo, ETH Zurich, CISPA, and RIKEN published a technical paper titled “PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems.” Abstract excerpt: “We reveal PuDGhost, an interference phenomenon where a PuD operation in a given column produces erroneous results due... » read more The post Interference Risks In Processing-Using-DRAM (U. of Tokyo, ETH Zurich, CISPA, Riken) appeared first on Semiconductor Engineering .
Source: Semiconductor Engineering — read the full report at the original publisher.