Researchers from Arizona State University and Texas Instruments India published a technical paper titled “SafeGen: LLM-Driven Assertion Generation and Fault Criticality Evaluation for Functional Safety.” Abstract Excerpt: “This paper presents SafeGen, an LLM-driven, formal-verification-assisted framework for functional-safety-oriented fault criticality assessment.” The paper also reports that “SafeGen generates higher-quality assertions than existing LLM-based assertion generation frameworks... » read more The post LLM-driven, Formal Verification-Assisted Framework For Functional-Safety-Orient
Source: Semiconductor Engineering — read the full report at the original publisher.