arXiv:2607.06625v1 Announce Type: new Abstract: Process industries have accumulated validated specialist models, yet sensor drift, feedstock variation, and regime switching cause these models to degrade systematically in new scenarios. Collecting new labeled data and retraining is costly, while continuing with the original model incurs persistent bias. Existing adaptation methods require modifying model parameters with sufficient labeled data, making rapid response on deployed systems difficult. Using LLMs as direct predictors risks hallucinations and uncontrollable outputs. Such predictors al
Source: arXiv cs.LG — read the full report at the original publisher.